BeamR2-Si InGaAs Scanning Slit Beam Profiler

Volume Pricing
Qty 1+	C$10,260.00 each
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Specifications

Physical & Mechanical Properties

Dimensions (mm):

60.96 x 67.31 x 66.17

Dimensional Accuracy:

±1µm

Optical Properties

Spectral Range:

190 - 1800

Beam Diameter (μm):

2µm to 4mm

Sensor

Frame Rate:

5Hz

Electrical

Signal to Noise S/N Ratio (dB):

1‚000:1

Maximum Power (W):

1 W Total & 0.5 mW/µm²

Threading & Mounting

Mount:

1/4-20 thread

Regulatory Compliance

Certificate of Conformance:

View

Product Details

Designed For Use From 190 to 1150nm
Measure Beam Diameters of 2µm to 4mm
Robust Easy to Use Software Provided

DataRay Scanning Slit Beam Profilers feature a silicon detector making it perfect for a 190 to 1150nm spectral range. Equipped with 2.5µm slits and larger knife-edge slits, the Beam'R2 is capable of measuring beams with diameters down to 2µm. Scanning slit instruments offer much higher resolution than camera-based systems, and are compatible with both continuous wave and pulsed laser sources. DataRay Scanning Slit Beam Profilers are ideal for optical assembly and instrument alignment, real-time diagnosis of focusing and alignment errors, real-time setting of multiple assemblies to the same focus. These profilers are USB 2.0 powered and include a 3m USB 2.0 cable.